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LineWorks SPACE

Advanced manufacturing quality control

Flagship LineWorks SPACE (Statistical Process Analysis & Control Environment) is a powerful infrastructure solution for advanced SPC that gives you complete control over production quality across all your manufacturing sites.

Relied upon by a wide range of global manufacturers, it has become the de facto standard in the semiconductor industry for integrated statistical process control. It interacts with multiple data sources and processes many thousands of online and offline charts, simultaneously.
It ensures you can track all your data by managing it within a centralized database, according to the ISO 9001 standard.

Benefits

Important Features

LineWorks SPACE Screenshot

Online - SPC

Offline - SPC

SPC-Reporting

Release 8 enables you to …

Examples

Capture and Analyze More Process Context

In SPACE 8, the maximum possible number of extractor and data keys in an LDS has been increased from 40 to 100. This additional data can capture additional potential root causes for OOC events, for example the tool, material, or timestamps of process steps before the current one. A new function to sort samples in charts by these context values allows to screen for the influence of these explanatory variables on the OOC parameter. The sorting can be combined with the grouping by matching combinations. Date and time as well as numerical values stored in the keys can be used as sorting criteria

Fine-grained Paste Attributes

A new paste attributes dialog allows to select more than 100 individual attributes for bulk change operations. Individual filter keys, valuation settings, or limits can now be transferred to multiple target objects. It is even possible to add, rearrange, or remove specific valuations without affecting the settings of other valuations. The attributes are arranged in a tree so that complete folders can be selected for pasting related attributes with a single selection.

Stack Calculated Parameters

In SPACE 8, calculated parameters can trigger further calculated parameters. This allows to integrate more complex black-box algorithms such as multivariate T2 control charts or machine learning algorithms implemented in different languages with pre-processing calculations implemented with standard SPACE calculation formulas or the ACO formula parser. Another use case is to split overly complex calculation formulas into several parts to make them more easily manageable.

Related camLine live Sessions

Visual Analytics to Improve Yield and Reliability
From Control Charts to Process Insights

Topics

Advanced Analytics on Collected Manufacturing Data
The SPACE Chart Plug-ins

Topics

Downloads

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